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John Kane, "Analyze the Attentive and Bypass Bias: Mock Vignette Checks in Survey Experiments"

  • Nov 6, 2020
  • 1 min read

Updated: Dec 6, 2020


International Methods Colloquium on November 6, 2020.

John V. Kane (NYU) presented a talk entitled "Analyze the Attentive and Bypass Bias: Mock Vignette Checks in Survey Experiments."

The slides are available at this link. The paper is available at this link.

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This material is based upon work supported by Wake Forest University and previously supported by Rice University and the National Science Foundation under Grant No. SES-1423825. The IMC is also sponsored by Springer Publishing.

 

Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation. 

 

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