John Kane, "Analyze the Attentive and Bypass Bias: Mock Vignette Checks in Survey Experiments"

International Methods Colloquium on November 6, 2020.

John V. Kane (NYU) presented a talk entitled "Analyze the Attentive and Bypass Bias: Mock Vignette Checks in Survey Experiments."

The slides are available at this link. The paper is available at this link.