

- Nov 6, 2020
John Kane, "Analyze the Attentive and Bypass Bias: Mock Vignette Checks in Survey Experiments"
International Methods Colloquium on November 6, 2020. John V. Kane (NYU) presented a talk entitled "Analyze the Attentive and Bypass Bias: Mock Vignette Checks in Survey Experiments." The slides are available at this link. The paper is available at this link.